Atmospheric neutron single-event burnout in Vertical Double-diffused Metal-Oxide-Semiconductor (VDMOS) devices
Xirui Zhou; Yuanyuan Zhang; Pei Li; Hao Yu; Chaohui He; Yuwei Guo; Haojie Bai
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Nuclear Engineering and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.net.2026.104195
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Cite this source
Xirui Zhou; Yuanyuan Zhang; Pei Li; Hao Yu; Chaohui He; Yuwei Guo; Haojie Bai. Atmospheric neutron single-event burnout in Vertical Double-diffused Metal-Oxide-Semiconductor (VDMOS) devices. Nuclear Engineering and Technology. 2026-06. https://doi.org/10.1016/j.net.2026.104195