Skip to content
Independent research & intelligence
OPEN VARIABLE

Evidence-First Signal Intelligence

Menu

Research literature / Conference paper

AI-Enhanced Semiconductor Yield Optimization Using Hybrid Deep Learning and Edge Data Analytics

Botlagunta Preethish Nandan; Majjari Venkata Kesava Kumar; Ravi Shankar Garapati; Velangani Divya Vardhan K. Bandi; P S L Narasimharao Davuluri; Bindu Madhavi Mangalampalli

Published
Publisher
IEEE
Journal / collection
2026 IEEE International Conference on AI Engineering and Innovations (AIEI)
Research area
AI & compute
Source type
Conference paper
DOI
10.1109/aiei69164.2026.11497190

Read the original source ↗

The original publisher provides the full text and its access options.

Cite this source

Botlagunta Preethish Nandan; Majjari Venkata Kesava Kumar; Ravi Shankar Garapati; Velangani Divya Vardhan K. Bandi; P S L Narasimharao Davuluri; Bindu Madhavi Mangalampalli. AI-Enhanced Semiconductor Yield Optimization Using Hybrid Deep Learning and Edge Data Analytics. 2026 IEEE International Conference on AI Engineering and Innovations (AIEI). 2026-03-26. https://doi.org/10.1109/aiei69164.2026.11497190

Download RIS