Novel Semiconductor Opening Switch Test Bed and Characterization
B. Esser; H. Spencer; M. Rawson; J. C. Stephens; J. C. Dickens; A. A. Neuber; J. A. Schrock; B. Hoff; S. Heidger; J. J. Mankowski
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE Pulsed Power & Plasma Science (PPPS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ppps56198.2025.11248529
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Cite this source
B. Esser; H. Spencer; M. Rawson; J. C. Stephens; J. C. Dickens; A. A. Neuber; J. A. Schrock; B. Hoff; S. Heidger; J. J. Mankowski. Novel Semiconductor Opening Switch Test Bed and Characterization. 2025 IEEE Pulsed Power & Plasma Science (PPPS). 2025-06-15. https://doi.org/10.1109/ppps56198.2025.11248529