A Compact One-Transistor-Multiple-RRAM Characterization Platform
Max Uhlmann; Milosz Krysik; Jianan Wen; Max Frohberg; Andrea Baroni; Keerthi Dorai Swamy Reddy; Eduardo Pérez; Philip Ostrovskyy; Krzysztof Piotrowski; Corrado Carta; Christian Wenger; Gerhard Kahmen
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Circuits and Systems I: Regular Papers
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tcsi.2025.3555234
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Cite this source
Max Uhlmann; Milosz Krysik; Jianan Wen; Max Frohberg; Andrea Baroni; Keerthi Dorai Swamy Reddy; Eduardo Pérez; Philip Ostrovskyy; Krzysztof Piotrowski; Corrado Carta; Christian Wenger; Gerhard Kahmen. A Compact One-Transistor-Multiple-RRAM Characterization Platform. IEEE Transactions on Circuits and Systems I: Regular Papers. 2025-10. https://doi.org/10.1109/tcsi.2025.3555234