An Adaptive PCA-RF-WKNN Algorithm for High-Dimensional Semiconductor Defect Classification
Gongli Li; Yidie Luo; Zhen Luo; Nick S. Bennett; Mohammad S. Islam
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Access
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/access.2026.3665185
The original publisher provides the full text and its access options.
Cite this source
Gongli Li; Yidie Luo; Zhen Luo; Nick S. Bennett; Mohammad S. Islam. An Adaptive PCA-RF-WKNN Algorithm for High-Dimensional Semiconductor Defect Classification. IEEE Access. 2026. https://doi.org/10.1109/access.2026.3665185