Aging mitigation of FinFET-based DFF through transistor-level analysis
Meng Li; Xin Xu; Yunpeng Li; Yiqun Shi; Qingqing Sun; Hao Zhu
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2025.115931
The original publisher provides the full text and its access options.
Cite this source
Meng Li; Xin Xu; Yunpeng Li; Yiqun Shi; Qingqing Sun; Hao Zhu. Aging mitigation of FinFET-based DFF through transistor-level analysis. Microelectronics Reliability. 2025-12. https://doi.org/10.1016/j.microrel.2025.115931