Thermal Modeling of Power Semiconductor Based on Loss-Temperature Data Measurement
Hyeonho Jeong; Seung-Woo Choi; Jiwon Yoo; Dong-Hyun Lim
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 28th International Conference on Electrical Machines and Systems (ICEMS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.23919/icems66262.2025.11317154
The original publisher provides the full text and its access options.
Cite this source
Hyeonho Jeong; Seung-Woo Choi; Jiwon Yoo; Dong-Hyun Lim. Thermal Modeling of Power Semiconductor Based on Loss-Temperature Data Measurement. 2025 28th International Conference on Electrical Machines and Systems (ICEMS). 2025-11-16. https://doi.org/10.23919/icems66262.2025.11317154