A Hybrid XGBoost–Random Forest Model for Fault Prediction in Semiconductor Manufacturing
Nada Ali Ezzi; Ibrahim Ahmed Al-Baltah; Ammar Thabit Zahary; Abdulqader M. Mohsen
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 International Conference on Digital Transformation, Innovation & Sustainable Development (DTISD)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/dtisd69661.2026.11668363
The original publisher provides the full text and its access options.
Cite this source
Nada Ali Ezzi; Ibrahim Ahmed Al-Baltah; Ammar Thabit Zahary; Abdulqader M. Mohsen. A Hybrid XGBoost–Random Forest Model for Fault Prediction in Semiconductor Manufacturing. 2026 International Conference on Digital Transformation, Innovation & Sustainable Development (DTISD). 2026-07. https://doi.org/10.1109/dtisd69661.2026.11668363