Accelerated flowers of sulfur test method for power semiconductor modules
Daniel T. Kaminski; Christopher Genthe; Benjamin C. Church
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2025.115870
The original publisher provides the full text and its access options.
Cite this source
Daniel T. Kaminski; Christopher Genthe; Benjamin C. Church. Accelerated flowers of sulfur test method for power semiconductor modules. Microelectronics Reliability. 2025-10. https://doi.org/10.1016/j.microrel.2025.115870