Low-Noise Reset Transistor for LOFIC CMOS Image Sensors Using a Two-Step Reset Scheme
Nao Kitajima; Kazuki Tatsuta; Ken Miyauchi; Hideki Owada; Isao Takayanagi; Shunsuke Okura
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/imfedk68916.2025.11353546
The original publisher provides the full text and its access options.
Cite this source
Nao Kitajima; Kazuki Tatsuta; Ken Miyauchi; Hideki Owada; Isao Takayanagi; Shunsuke Okura. Low-Noise Reset Transistor for LOFIC CMOS Image Sensors Using a Two-Step Reset Scheme. 2025 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK). 2025-11-13. https://doi.org/10.1109/imfedk68916.2025.11353546