Using DC Transistor Characterization Measurements for LNA Design at Cryogenic Temperatures
Giovani Britton; Salvador Mir; Estelle Lauga-Larroze; Benjamin Dormieu; José Lugo; Joao Azevedo; Sebastien Sadlo; Quentin Berlingard; Mikaël Cassé; Philippe Galy
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Journal of Electronic Testing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10836-026-06228-3
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Cite this source
Giovani Britton; Salvador Mir; Estelle Lauga-Larroze; Benjamin Dormieu; José Lugo; Joao Azevedo; Sebastien Sadlo; Quentin Berlingard; Mikaël Cassé; Philippe Galy. Using DC Transistor Characterization Measurements for LNA Design at Cryogenic Temperatures. Journal of Electronic Testing. 2026-04. https://doi.org/10.1007/s10836-026-06228-3