Quantitative Analysis and Mitigation Strategy for Hot Carrier Degradation in a‐IGZO Transistor
Changeon Jin; Sunwoong Ham; Taewon Seo; Dae Hwan Kang; Yoonyoung Chung
- Published
- Publisher
- Wiley
- Journal / collection
- Advanced Electronic Materials
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1002/aelm.202500817
The original publisher provides the full text and its access options.
Cite this source
Changeon Jin; Sunwoong Ham; Taewon Seo; Dae Hwan Kang; Yoonyoung Chung. Quantitative Analysis and Mitigation Strategy for Hot Carrier Degradation in a‐IGZO Transistor. Advanced Electronic Materials. 2026-03-30. https://doi.org/10.1002/aelm.202500817