Unsupervised Learning-Based Clustering Algorithm for Potential Outlier Detection in Semiconductor Manufacturing Process
Ki-Jae Shin; Tae-Yoon Kim; Young-Shin Han; Jong-Sik Lee
- Published
- Publisher
- Korea Multimedia Society
- Journal / collection
- Journal of Korea Multimedia Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.9717/kmms.2026.29.2.464
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Cite this source
Ki-Jae Shin; Tae-Yoon Kim; Young-Shin Han; Jong-Sik Lee. Unsupervised Learning-Based Clustering Algorithm for Potential Outlier Detection in Semiconductor Manufacturing Process. Journal of Korea Multimedia Society. 2026-02-28. https://doi.org/10.9717/kmms.2026.29.2.464