Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition
M. M. Manjurul Islam; Girijesh Prasad
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Scientific Reports
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1038/s41598-026-63373-7
The original publisher provides the full text and its access options.
Cite this source
M. M. Manjurul Islam; Girijesh Prasad. Unsupervised feature learning and optimised clustering with fine-tuning for automatic semiconductor wafer defect recognition. Scientific Reports. 2026-07-23. https://doi.org/10.1038/s41598-026-63373-7