Activating Phase-Transition Toughening in van der Waals Semiconductor GaTe
Ruihan Xu; Boxiang Gao; Danlei Zhao; Jingzhuo Zhou; Qi Zhu; Yupeng Ma; Binzhao Li; Yi Zhang; Juzheng Chen; Qian Zhang; Fanling Meng; Johnny C. Ho; Maolin Yu; Yang Lu
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Nano Letters
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/acs.nanolett.6c01935
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Cite this source
Ruihan Xu; Boxiang Gao; Danlei Zhao; Jingzhuo Zhou; Qi Zhu; Yupeng Ma; Binzhao Li; Yi Zhang; Juzheng Chen; Qian Zhang; Fanling Meng; Johnny C. Ho; Maolin Yu; Yang Lu. Activating Phase-Transition Toughening in van der Waals Semiconductor GaTe. Nano Letters. 2026-07-07. https://doi.org/10.1021/acs.nanolett.6c01935