Quantitative Analysis of the Semiconductor–Electrolyte Interface Using Cyclic Voltammetry Measurements
Pierpaolo Vecchi; Matthew J. Goodwin; Devon P. Leimkuhl; John C. Dickenson; Gabriela P. Bein; Megan N. Jackson; James F. Cahoon; Jillian L. Dempsey; Gerald J. Meyer; Renato N. Sampaio
- Published
- Publisher
- American Chemical Society (ACS)
- Journal / collection
- Journal of the American Chemical Society
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1021/jacs.5c18135
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Cite this source
Pierpaolo Vecchi; Matthew J. Goodwin; Devon P. Leimkuhl; John C. Dickenson; Gabriela P. Bein; Megan N. Jackson; James F. Cahoon; Jillian L. Dempsey; Gerald J. Meyer; Renato N. Sampaio. Quantitative Analysis of the Semiconductor–Electrolyte Interface Using Cyclic Voltammetry Measurements. Journal of the American Chemical Society. 2026-03-06. https://doi.org/10.1021/jacs.5c18135