Impact of the external gate resistance on the power CoolMOS transistor transient switching dynamics
Sara Laafar; Najib Boumaaz; Abdelhadi Elbacha; Badredine Lamuadni; Asmaa Maali; Abdallah Soulmani
- Published
- Publisher
- Springer Science and Business Media LLC
- Journal / collection
- Analog Integrated Circuits and Signal Processing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1007/s10470-025-02487-w
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Cite this source
Sara Laafar; Najib Boumaaz; Abdelhadi Elbacha; Badredine Lamuadni; Asmaa Maali; Abdallah Soulmani. Impact of the external gate resistance on the power CoolMOS transistor transient switching dynamics. Analog Integrated Circuits and Signal Processing. 2025-08-28. https://doi.org/10.1007/s10470-025-02487-w