Resource-Efficient Deployment of Deep Learning Models for Semiconductor Defect Classification on Embedded Devices
Wei-Xuan Lim; Marco Wagner; Cheng Yee Low; Uwe Gleiter
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/melecon64486.2026.11418805
The original publisher provides the full text and its access options.
Cite this source
Wei-Xuan Lim; Marco Wagner; Cheng Yee Low; Uwe Gleiter. Resource-Efficient Deployment of Deep Learning Models for Semiconductor Defect Classification on Embedded Devices. 2026 IEEE 23rd Mediterranean Electrotechnical Conference (MELECON). 2026-02-02. https://doi.org/10.1109/melecon64486.2026.11418805