A Framework for Hallucination-Mitigating Manufacturing Anomaly Detection
Seongmin Han; Jonghwa Shim; Eenjun Hwang
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Conference on Big Data and Smart Computing (BigComp)
- Research area
- Industrial systems
- Source type
- Conference paper
- DOI
- 10.1109/bigcomp68355.2026.00039
The original publisher provides the full text and its access options.
Cite this source
Seongmin Han; Jonghwa Shim; Eenjun Hwang. A Framework for Hallucination-Mitigating Manufacturing Anomaly Detection. 2026 IEEE International Conference on Big Data and Smart Computing (BigComp). 2026-02-02. https://doi.org/10.1109/bigcomp68355.2026.00039