Diverse Sharpness-Aware Minimization for Machine Learning Force Fields in Semiconductor Simulations
Dong-Hee Shin; Young-Han Son; Tae-Eui Kam
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 22nd International SoC Design Conference (ISOCC)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/isocc66390.2025.11330061
The original publisher provides the full text and its access options.
Cite this source
Dong-Hee Shin; Young-Han Son; Tae-Eui Kam. Diverse Sharpness-Aware Minimization for Machine Learning Force Fields in Semiconductor Simulations. 2025 22nd International SoC Design Conference (ISOCC). 2025-10-15. https://doi.org/10.1109/isocc66390.2025.11330061