Sharpness-aware minimization with physics-informed regularizations for predicting semiconductor material properties in molecular dynamics
Dong-Hee Shin; Young-Han Son; Tae-Eui Kam
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Chemometrics and Intelligent Laboratory Systems
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.chemolab.2025.105511
The original publisher provides the full text and its access options.
Cite this source
Dong-Hee Shin; Young-Han Son; Tae-Eui Kam. Sharpness-aware minimization with physics-informed regularizations for predicting semiconductor material properties in molecular dynamics. Chemometrics and Intelligent Laboratory Systems. 2025-12. https://doi.org/10.1016/j.chemolab.2025.105511