Mechanistic evaluation of amorphous InGaZnO-based one transistor–one capacitor memory cell via fast current–voltage measurements and modeling
Juneseong Choi; Minsub Um; Hyobin Park; Jinheon Choi; Sahngik Aaron Mun; Jaewon Ham; Seoryong Park; Hyungjeung Kim; Shihyun Kim; Subin Moon; Jonghoon Shin; Cheol Seong Hwang
- Published
- Publisher
- Royal Society of Chemistry (RSC)
- Journal / collection
- Nanoscale
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1039/d6nr00995f
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Juneseong Choi; Minsub Um; Hyobin Park; Jinheon Choi; Sahngik Aaron Mun; Jaewon Ham; Seoryong Park; Hyungjeung Kim; Shihyun Kim; Subin Moon; Jonghoon Shin; Cheol Seong Hwang. Mechanistic evaluation of amorphous InGaZnO-based one transistor–one capacitor memory cell via fast current–voltage measurements and modeling. Nanoscale. 2026. https://doi.org/10.1039/d6nr00995f