A Novel SCR Topology of Embedded Bipolar Transistor With High-Holding Voltage and High-Temperature Tolerance for ESD Protection
Yujie Liu; Yang Wang; Ke Zhang; Jian Yang; Xiangliang Jin
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Electron Devices
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/ted.2025.3586260
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Cite this source
Yujie Liu; Yang Wang; Ke Zhang; Jian Yang; Xiangliang Jin. A Novel SCR Topology of Embedded Bipolar Transistor With High-Holding Voltage and High-Temperature Tolerance for ESD Protection. IEEE Transactions on Electron Devices. 2025-09. https://doi.org/10.1109/ted.2025.3586260