Multi-Objective Bayesian Target Interval Optimization for Semiconductor Process Parameters
Xiao Yang; Xingyu Qin; Yujie Zhang; Jianwang Zhai; Kang Zhao
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 International Symposium of Electronics Design Automation (ISEDA)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/iseda65950.2025.11100726
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Cite this source
Xiao Yang; Xingyu Qin; Yujie Zhang; Jianwang Zhai; Kang Zhao. Multi-Objective Bayesian Target Interval Optimization for Semiconductor Process Parameters. 2025 International Symposium of Electronics Design Automation (ISEDA). 2025-05-09. https://doi.org/10.1109/iseda65950.2025.11100726