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Research literature / Conference paper

Analytical and Experimental Methods for Junction Temperature Estimation in Power Semiconductor Modules

David L. Valentim; Ádrian L. S. De Oliveira; Gabriel A. F. De Oliveira; Allan F. Cupertino; João V. M. Farias; Heverton A. Pereira; João H. De Oliveira; Erick M. S. Brito

Published
Publisher
IEEE
Journal / collection
2025 Brazilian Power Electronics Conference (COBEP)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/cobep66423.2025.11231640

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David L. Valentim; Ádrian L. S. De Oliveira; Gabriel A. F. De Oliveira; Allan F. Cupertino; João V. M. Farias; Heverton A. Pereira; João H. De Oliveira; Erick M. S. Brito. Analytical and Experimental Methods for Junction Temperature Estimation in Power Semiconductor Modules. 2025 Brazilian Power Electronics Conference (COBEP). 2025-10-05. https://doi.org/10.1109/cobep66423.2025.11231640

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