Machine-Learning-Assisted, Process-Variation-Aware Transistor Sizing of CMOS Current Mirrors Using Foundry-Accurate Spectre Simulations
Absar Alam; Chhavi Dhiman
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 6th International Conference on Emerging VLSI and Semiconductor Technology for AI and Computing Applications (EVST)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/evst69093.2026.11660575
The original publisher provides the full text and its access options.
Cite this source
Absar Alam; Chhavi Dhiman. Machine-Learning-Assisted, Process-Variation-Aware Transistor Sizing of CMOS Current Mirrors Using Foundry-Accurate Spectre Simulations. 2026 6th International Conference on Emerging VLSI and Semiconductor Technology for AI and Computing Applications (EVST). 2026-06. https://doi.org/10.1109/evst69093.2026.11660575