ANALYSIS OF ELECTRICAL PARAMETERS OF SEMICONDUCTOR DEVICES
Joint-Stock Company Scientific Production Enterprise Iskra Plant; E.A. Garanzha; Ulyanovsk State Technical University; Ya.O. Fokin; Joint-Stock Company Scientific Production Enterprise Iskra Plant; Ulyanovsk State Technical University
- Published
- Publisher
- Ulyanovsk State Technical University
- Journal / collection
- Materials of the 28th All-Russian Youth Scientific Conference
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.61527/appfe-2025.150-151
The original publisher provides the full text and its access options.
Cite this source
Joint-Stock Company Scientific Production Enterprise Iskra Plant; E.A. Garanzha; Ulyanovsk State Technical University; Ya.O. Fokin; Joint-Stock Company Scientific Production Enterprise Iskra Plant; Ulyanovsk State Technical University. ANALYSIS OF ELECTRICAL PARAMETERS OF SEMICONDUCTOR DEVICES. Materials of the 28th All-Russian Youth Scientific Conference. 2025-10-13. https://doi.org/10.61527/appfe-2025.150-151