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Research literature / Journal article

Extending the Schottky–Mott Rule to Atomic Thickness: Descriptors for Two-Dimensional Semiconductor–Metal Contacts

Xing Yu; Xinyu Chen; Xuchen Yu; Qionghua Zhou; Liang Ma; Jinlan Wang

Published
Publisher
American Chemical Society (ACS)
Journal / collection
Nano Letters
Research area
Semiconductors
Source type
Journal article
DOI
10.1021/acs.nanolett.5c05343

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Xing Yu; Xinyu Chen; Xuchen Yu; Qionghua Zhou; Liang Ma; Jinlan Wang. Extending the Schottky–Mott Rule to Atomic Thickness: Descriptors for Two-Dimensional Semiconductor–Metal Contacts. Nano Letters. 2025-12-01. https://doi.org/10.1021/acs.nanolett.5c05343

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