Analysis of the 16-Term Error Model Coefficients: Evaluating Measurement Setup Leakages and Their Impact on Transistor Characterization up to 325 GHz
Tarek Bouzar; Jojo Varghese; Jean-Daniel Arnould; Nicolas Derrier; Magali De Matos; Loic Vincent; Damien Passerieux; Thomas Zimmer; Sébastien Fregonese
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Microwave Theory and Techniques
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tmtt.2026.3666244
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Cite this source
Tarek Bouzar; Jojo Varghese; Jean-Daniel Arnould; Nicolas Derrier; Magali De Matos; Loic Vincent; Damien Passerieux; Thomas Zimmer; Sébastien Fregonese. Analysis of the 16-Term Error Model Coefficients: Evaluating Measurement Setup Leakages and Their Impact on Transistor Characterization up to 325 GHz. IEEE Transactions on Microwave Theory and Techniques. 2026-05. https://doi.org/10.1109/tmtt.2026.3666244