Improving Electromigration Lifetime Though Power Grid Segmentation: An Experimental Study
Robert P. Bloom; Chris H. Kim; Armen Kteyan; Valeriy Sukharev; Stephane Moreau
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE International Reliability Physics Symposium (IRPS)
- Research area
- Energy & infrastructure
- Source type
- Conference paper
- DOI
- 10.1109/irps61424.2026.11499330
The original publisher provides the full text and its access options.
Cite this source
Robert P. Bloom; Chris H. Kim; Armen Kteyan; Valeriy Sukharev; Stephane Moreau. Improving Electromigration Lifetime Though Power Grid Segmentation: An Experimental Study. 2026 IEEE International Reliability Physics Symposium (IRPS). 2026-03-22. https://doi.org/10.1109/irps61424.2026.11499330