Radiation-Resistant ZnO Thin-Film Transistor Voltage Reference
Na Bai; Guocheng Ge; Hanxiang Li; Ying Wu; Aibin Yan; Xiaoqing Wen
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 34th Asian Test Symposium (ATS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ats66998.2025.00026
The original publisher provides the full text and its access options.
Cite this source
Na Bai; Guocheng Ge; Hanxiang Li; Ying Wu; Aibin Yan; Xiaoqing Wen. Radiation-Resistant ZnO Thin-Film Transistor Voltage Reference. 2025 IEEE 34th Asian Test Symposium (ATS). 2025-12-16. https://doi.org/10.1109/ats66998.2025.00026