Self-Referenced Terahertz Sheet Conductance Determination of Thin Semiconductor Layers in Reflection and Transmission Geometry
Konstantin Wenzel; Steffen Breuer; Alexander Kleinkamp; Alexander Dohms; Tina-Celine Heselmann; Shahram Keyvaninia; Martin Schell; Robert B. Kohlhaas; Lars Liebermeister
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Terahertz Science and Technology
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tthz.2026.3693845
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Cite this source
Konstantin Wenzel; Steffen Breuer; Alexander Kleinkamp; Alexander Dohms; Tina-Celine Heselmann; Shahram Keyvaninia; Martin Schell; Robert B. Kohlhaas; Lars Liebermeister. Self-Referenced Terahertz Sheet Conductance Determination of Thin Semiconductor Layers in Reflection and Transmission Geometry. IEEE Transactions on Terahertz Science and Technology. 2026-08. https://doi.org/10.1109/tthz.2026.3693845