Virtual Sensing for Solder Layer Degradation and Temperature Monitoring in Insulated Gate Bipolar Transistor Modules
Andrea Urgolo; Monika Stipsitz; Hèlios Sanchis-Alepuz
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 9th International Conference on System Reliability and Safety (ICSRS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/icsrs68021.2025.11422051
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Cite this source
Andrea Urgolo; Monika Stipsitz; Hèlios Sanchis-Alepuz. Virtual Sensing for Solder Layer Degradation and Temperature Monitoring in Insulated Gate Bipolar Transistor Modules. 2025 9th International Conference on System Reliability and Safety (ICSRS). 2025-11-26. https://doi.org/10.1109/icsrs68021.2025.11422051