Deep Clustering with Unsupervised Representation Learning for Semiconductor Wafer Defect Pattern Analysis and Yield Improvement
Sowmya A Patil; Manas M N
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 9th International Conference on Computational System and Information Technology for Sustainable Solutions (CSITSS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/csitss67709.2025.11295703
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Cite this source
Sowmya A Patil; Manas M N. Deep Clustering with Unsupervised Representation Learning for Semiconductor Wafer Defect Pattern Analysis and Yield Improvement. 2025 9th International Conference on Computational System and Information Technology for Sustainable Solutions (CSITSS). 2025-11-20. https://doi.org/10.1109/csitss67709.2025.11295703