Comprehensive Framework for Identifying and Visualizing Key Yield Factors in Semiconductor Manufacturing
Gyeunggeun Doh; Jeongwoo Seo; Sanghoun Oh; Minseok Song
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Semiconductor Manufacturing
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tsm.2026.3673232
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Cite this source
Gyeunggeun Doh; Jeongwoo Seo; Sanghoun Oh; Minseok Song. Comprehensive Framework for Identifying and Visualizing Key Yield Factors in Semiconductor Manufacturing. IEEE Transactions on Semiconductor Manufacturing. 2026-05. https://doi.org/10.1109/tsm.2026.3673232