Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor After NBT Stress and Relaxation
Dunja Đorđević; Lana Tasić; Nevena Veselinović; Marija Petrović; Sandra Veljković; Nikola Mitrović; Miloš Marjanović; Emilija Živanović; Goran Ristić; Danijel Danković
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE 34th International Conference on Microelectronics (MIEL)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/miel66332.2025.11261184
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Dunja Đorđević; Lana Tasić; Nevena Veselinović; Marija Petrović; Sandra Veljković; Nikola Mitrović; Miloš Marjanović; Emilija Živanović; Goran Ristić; Danijel Danković. Investigation of the Self-Heating Effect in a P-Channel VDMOS Transistor After NBT Stress and Relaxation. 2025 IEEE 34th International Conference on Microelectronics (MIEL). 2025-10-13. https://doi.org/10.1109/miel66332.2025.11261184