A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation Mechanisms
Joseph B. Bernstein; Tsuriel Avraham; Bin Wang
- Published
- Publisher
- MDPI AG
- Journal / collection
- Micromachines
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/mi17030320
The original publisher provides the full text and its access options.
Cite this source
Joseph B. Bernstein; Tsuriel Avraham; Bin Wang. A Physics-Consistent Framework for Semiconductor Device Reliability Including Multiple Degradation Mechanisms. Micromachines. 2026-03-04. https://doi.org/10.3390/mi17030320