Defect Prediction and Optimization in Semiconductor Manufacturing Using Explainable AutoML
Min Yin
- Published
- Publisher
- Southern United Academy of Sciences Limited
- Journal / collection
- Academic Journal of Natural Science
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.70393/616a6e73.333533
The original publisher provides the full text and its access options.
Cite this source
Min Yin. Defect Prediction and Optimization in Semiconductor Manufacturing Using Explainable AutoML. Academic Journal of Natural Science. 2025-12-03. https://doi.org/10.70393/616a6e73.333533