TDDB Stress Test Coverage Quantification using Cell-aware Transistor State Stress Model
Vladimir A. Zivkovic; Stephan Eggersglüβ; Andreas Glowatz; Daniel Tille
- Published
- Publisher
- IEEE
- Journal / collection
- 2026 IEEE European Test Symposium (ETS)
- Research area
- Semiconductors
- Source type
- Conference paper
- DOI
- 10.1109/ets69887.2026.11591779
The original publisher provides the full text and its access options.
Cite this source
Vladimir A. Zivkovic; Stephan Eggersglüβ; Andreas Glowatz; Daniel Tille. TDDB Stress Test Coverage Quantification using Cell-aware Transistor State Stress Model. 2026 IEEE European Test Symposium (ETS). 2026-05-25. https://doi.org/10.1109/ets69887.2026.11591779