Analysis of charge-trapping effects in ultra-low current metal–oxide–semiconductor–oxide–semiconductor devices
Piotr Wiśniewski; Piotr Jeżak; Michał Jarosik
- Published
- Publisher
- AIP Publishing
- Journal / collection
- AIP Advances
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1063/5.0259827
The original publisher provides the full text and its access options.
Cite this source
Piotr Wiśniewski; Piotr Jeżak; Michał Jarosik. Analysis of charge-trapping effects in ultra-low current metal–oxide–semiconductor–oxide–semiconductor devices. AIP Advances. 2025-09-01. https://doi.org/10.1063/5.0259827