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Research literature / Conference paper

Design and Verification of Transistor Junction Temperature Measurement Experimental System Based on Thermo-Sensitive Electrical Parameter Method

Hu Yang; Hongjuan Zhang

Published
Publisher
IEEE
Journal / collection
2026 5th International Conference on Electronics, Integrated Circuits and Communication Technology (EICCT)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/eicct69950.2026.11564233

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Hu Yang; Hongjuan Zhang. Design and Verification of Transistor Junction Temperature Measurement Experimental System Based on Thermo-Sensitive Electrical Parameter Method. 2026 5th International Conference on Electronics, Integrated Circuits and Communication Technology (EICCT). 2026-04-24. https://doi.org/10.1109/eicct69950.2026.11564233

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