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Research literature / Conference paper

Response Analysis of the Darlington Transistor Amplification Mode under Transient Electrical Stress

Changjun Li; Jinjun Cheng; Xiaoxu Chu; Haizhen Zhu; Bincheng Wen; Fawen Xu

Published
Publisher
IEEE
Journal / collection
2026 International Conference on Generative Artificial Intelligence and Information Security (GAIIS)
Research area
Semiconductors
Source type
Conference paper
DOI
10.1109/gaiis69281.2026.11519246

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Changjun Li; Jinjun Cheng; Xiaoxu Chu; Haizhen Zhu; Bincheng Wen; Fawen Xu. Response Analysis of the Darlington Transistor Amplification Mode under Transient Electrical Stress. 2026 International Conference on Generative Artificial Intelligence and Information Security (GAIIS). 2026-03-27. https://doi.org/10.1109/gaiis69281.2026.11519246

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