Deep Learning-based IC Monitoring
Iresh M Jayawardana; Krishna Dahal; Spyros Tragoudas; Khader Abdel Hafez; Danushka Senarathna
- Published
- Publisher
- IEEE
- Journal / collection
- 2025 IEEE International Test Conference (ITC)
- Research area
- AI & compute
- Source type
- Conference paper
- DOI
- 10.1109/itc58126.2025.00080
The original publisher provides the full text and its access options.
Cite this source
Iresh M Jayawardana; Krishna Dahal; Spyros Tragoudas; Khader Abdel Hafez; Danushka Senarathna. Deep Learning-based IC Monitoring. 2025 IEEE International Test Conference (ITC). 2025-09-20. https://doi.org/10.1109/itc58126.2025.00080