Analytical Modeling of Temperature-Resilient Cylindrical Gate Engineered Ferroelectric Nanowire Field-Effect Transistor
Aapurva Kaul; Snehlata Yadav; Sonam Rewari; Deva Nand
- Published
- Publisher
- Institute of Electrical and Electronics Engineers (IEEE)
- Journal / collection
- IEEE Transactions on Dielectrics and Electrical Insulation
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1109/tdei.2025.3538754
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Cite this source
Aapurva Kaul; Snehlata Yadav; Sonam Rewari; Deva Nand. Analytical Modeling of Temperature-Resilient Cylindrical Gate Engineered Ferroelectric Nanowire Field-Effect Transistor. IEEE Transactions on Dielectrics and Electrical Insulation. 2025-10. https://doi.org/10.1109/tdei.2025.3538754