Improved Reliability and Thermal Stability in Amorphous Oxide Semiconductor Transistors
Christopher L. Hinkle
- Published
- Publisher
- The Electrochemical Society
- Journal / collection
- ECS Meeting Abstracts
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1149/ma2026-01221257mtgabs
The original publisher provides the full text and its access options.
Cite this source
Christopher L. Hinkle. Improved Reliability and Thermal Stability in Amorphous Oxide Semiconductor Transistors. ECS Meeting Abstracts. 2026-07-07. https://doi.org/10.1149/ma2026-01221257mtgabs