High-endurance bulk CMOS one-transistor cryo-memory
A. Zaslavsky; P.R. Shrestha; V.Ortiz Jimenez; J.P. Campbell; C.A. Richter
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Solid-State Electronics
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.sse.2025.109097
The original publisher provides the full text and its access options.
Cite this source
A. Zaslavsky; P.R. Shrestha; V.Ortiz Jimenez; J.P. Campbell; C.A. Richter. High-endurance bulk CMOS one-transistor cryo-memory. Solid-State Electronics. 2025-06. https://doi.org/10.1016/j.sse.2025.109097