X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis
Yumeng Jiang; Zhenwei Zhang; Zhongyi An; Xinyu Pan; Xinmin Shi; Ruonan Wang; Jiajian Li; Chengzhi Chen; Zhiqiang Cao; Yong Xu; Jiaqi Wei; Xueying Zhang; Yi Peng
- Published
- Publisher
- MDPI AG
- Journal / collection
- Crystals
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.3390/cryst16040265
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Cite this source
Yumeng Jiang; Zhenwei Zhang; Zhongyi An; Xinyu Pan; Xinmin Shi; Ruonan Wang; Jiajian Li; Chengzhi Chen; Zhiqiang Cao; Yong Xu; Jiaqi Wei; Xueying Zhang; Yi Peng. X-Ray Characterization of Semiconductor Materials and Advanced Packaging: A Perspective on Multidimensional Structural Analysis. Crystals. 2026-04-14. https://doi.org/10.3390/cryst16040265