Wafer-scale flexible silicon transistor: The role of thinning induced stress and defects on device performance
Neng Gao; Zhaoxian Wang; Xin Song; Dongliang Liu; Ying Chang; Wei Jian; Taisong Pan; Wei Qiu; Ying Chen; Yuan Lin; Xue Feng
- Published
- Publisher
- Tsinghua University Press
- Journal / collection
- Nano Research
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.26599/nr.2026.94908642
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Cite this source
Neng Gao; Zhaoxian Wang; Xin Song; Dongliang Liu; Ying Chang; Wei Jian; Taisong Pan; Wei Qiu; Ying Chen; Yuan Lin; Xue Feng. Wafer-scale flexible silicon transistor: The role of thinning induced stress and defects on device performance. Nano Research. 2026-07. https://doi.org/10.26599/nr.2026.94908642