Yield prediction in semiconductor manufacturing using two-step machine learning
Rebecca Busch; Peter Czerner; Michael Wahl; Bhaskar Choubey
- Published
- Publisher
- Informa UK Limited
- Journal / collection
- International Journal of Production Research
- Research area
- AI & compute
- Source type
- Journal article
- DOI
- 10.1080/00207543.2025.2601804
The original publisher provides the full text and its access options.
Cite this source
Rebecca Busch; Peter Czerner; Michael Wahl; Bhaskar Choubey. Yield prediction in semiconductor manufacturing using two-step machine learning. International Journal of Production Research. 2025-12-14. https://doi.org/10.1080/00207543.2025.2601804