Towards Extended Hückel model-based reliability performance enhancement of gate stack graphene nanoribbon field effect transistor
Anshul; Rishu Chaujar
- Published
- Publisher
- Elsevier BV
- Journal / collection
- Microelectronics Reliability
- Research area
- Semiconductors
- Source type
- Journal article
- DOI
- 10.1016/j.microrel.2025.115869
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Cite this source
Anshul; Rishu Chaujar. Towards Extended Hückel model-based reliability performance enhancement of gate stack graphene nanoribbon field effect transistor. Microelectronics Reliability. 2025-10. https://doi.org/10.1016/j.microrel.2025.115869